Saykally Group: Second-harmonic generation with soft X-rays probes buried interfaces

In a proof-of-concept study, Richard J. Saykally and a large team of researchers working at the FERMI facility in Trieste, Italy, have demonstrated that the method can selectively probe layers of graphene inside a graphite sample (Phys. Rev. Lett. 2018, DOI: 10.1103/physrevlett.120.023901). The new technique may eventually enable researchers to use X-rays to track chemical reactions at interfaces with femtosecond resolution.